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It is applicable to IGBT, FRD, high voltage and high current test, solar cell test, diode transistor test, back electrode test, etc. in wafer factories, research institutes and universities.

The sample suction cup can move four degrees of freedom to facilitate scanning and focusing. The vibration isolation base is designed to facilitate fine measurement.

HGPS200 probe station:

High flatness: precision ground ferromagnetic stainless steel table top

Compact structure: overall design

Visual test: binocular microscope

Flexible test: suction cup air hole is controlled independently

HGPT-PS200 multifunctional vibration isolation magnetic absorption workbench:

The base can be purchased separately

Convenient and free construction

Various probe measurement experimental systems or other experimental platform systems

The manual precision vibration isolation probe table adopts the vibration isolation support design base to realize fine measurement

When using the isolation support, the 1 micron probe tip has no jitter and is clearly visible, and the ordinary rigid support has obvious jitter.